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Specification:

1. Parameter measured under normal temperature �](0-99); Switching time T(0.01�gs-99.9�gs),including Tr, Ts, Tf; VCES(0-2V),VBE(0-2V); Leakage current ICEO(0.01�gA-99.9mA)
�@�@Withstand voltage BVCEO(50V-650V)
2. Parameter measured under high temperature: VBE, �], ICEO
3. Compare the measuring results VBE, �], ICEO gotten under normal and high temperature, to those changes exceed preset limits, the selector alarms to let operator to pick them out
4. Divide T and �] into several groups, selector can display group number and alarm when measured values of VBE, �], ICEO exceed the limit, indicating the unqualified item.
5. Freely adjusting or setting of test conditions according to requirement
A�B �] testing: three different Ib:0.1mA�B1mA�B10mA
B�B Switching time test: 4 Ic different: 0.5A�B0.25A�B0.1A�B0.05A
�@the corresponding current Ib:0.1A�B0.05A�B0.02A�B0.01A
C�B Heating condition for transistor:
�@ Heating voltage:5 ~ 20V Continuously adjustable
�@ Heating current:0.05 ~ 2A Continuously adjustable
�@ Heating time:0 ~ 9.9s Continuously adjustable
6. Dividing value and limit value freely set, automatically saving to any power cut; the�@�@instrument can save 20 different setting, choose one setting when using;
7. Measured values displayed in four windows, easily read, printable.